If you're looking for sentech.com.com's Adword's Competitors iSpionage Competitor Research is the right product for you
Top Competitors for sentech.com
| PPC Budget | # Keywords | # Overlap kw | ||
|---|---|---|---|---|
| gaertnerscientific.com | $35 | 37 | 1 | Learn More |
| film-sense.com | $13 | 41 | 1 | Learn More |
| covalentmetrology.com | $31 | 73 | 1 | Learn More |
| horiba.com | $2 | 208 | 1 | Learn More |
| filmetrics.com | $295 | 259 | 1 | Learn More |
Competitor offers & landing pages
Sample SEO Keywords for: sentech.com
Organic Listings | 1st Page Keywords | Avg Pos | Pos Trend | Est.Traffic | Traffic Value | |
|---|---|---|---|---|---|---|
Spectroscopic ellipsometry by SENTECH - SENTECH Instruments http://www.sentech.com/en/specSpectroscopic ellipsometry wit | 9 | 10.4 ( 0.6 ) | 1880 | $29 | ||
| Keyword | Position | Trend | Search Vol | CPC | ||
| spectroscopic ellipsometry | 5 ( 4 ) | 110 | $15.35 | |||
| spectroscopic ellipsometer | 7 ( 2.5 ) | 40 | $11.23 | |||
| ellipsometer price | 10.5 ( 5.5 ) | 10 | $3.75 | |||
| ellipsometer | 12 ( 3 ) | 590 | $11.35 | |||
| elipsometry | 20.5 ( 1.5 ) | 50 | $9.27 | |||
Atomic Layer Deposition & PEALD systems by SENTECH http://www.sentech.com/en/AtomAtomic Layer Deposition & PEAL | 3 | 11 ( 2 ) | 750 | $3 | ||
| Keyword | Position | Trend | Search Vol | CPC | ||
| ald systems | 11 | 10 | $2.71 | |||
| atomic-layer deposition | 13 | 720 | $3.93 | |||
| ald system | 8 | 20 | $3.83 | |||
Top Ads
The new SENTECH ellipsometer | SENresearch 4.0 | Contact Us Widest spectral range 190 -3500 nm & full Mueller Matrix Measurement! Discover Quality Products... www.sentech.com/ The new SENTECH spectroscopic | ellipsometer SENresearch 4.0 Widest spectral range 190 -3500 nm & full Mueller Matrix Measurement! Complex Layer Stacks. Step Scan Analyser. SpectraRay/4. Modular Concept. www.sentech.com/ The new SENTECH spectroscopic | ellipsometer SENresearch 4.0 Widest spectral range 190 -3500 nm & full Mueller Matrix Measurement! SpectraRay/4. Step Scan Analyser. complex layer stacks. modular concept. www.sentech.com/ The new SENTECH spectroscopic | ellipsometer SENresearch 4.0 Widest spectral range 190 -3500 nm & full Mueller Matrix Measurement! modular concept. complex layer stacks. Step Scan Analyser. SpectraRay/4. www.sentech.com/ | |||
Spectroscopic ellipsometry - | New SENresearch 4.0 by SENTECH Highest precision by SSA principle & widest spectral range 190 -3500 nm. www.sentech.com/ The new SENTECH spectroscopic | ellipsometer SENresearch 4.0 Widest spectral range 190 -3500 nm & full Mueller Matrix Measurement! www.sentech.com/ Measuring film thickness | with the new SENresearch 4.0 Measuring film thickness on an advanced level by SENTECH ellipsometry. SpectraRay/4. complex layer stacks. modular concept. Step Scan Analyser. www.sentech.com/ |
